KJ7102X1-BA1模块备件

KJ7102X1-BA1

3个EIA单元（5.25英寸），允许每次安装
以确定每个机柜内的安装位置。
用户可以决定重新使用现有的线路/电缆槽，
相邻安装每个组件，或使用
每个组件之间的间距。三角洲魅力允许
通过允许安装每个组件实现安装灵活性
根据需要，为每个客户实现佳结果
终止安装。
每个CHARM用作电路保护装置和现场接线
断开。信号受电流限制或熔断以保护
防止接地线路故障。每一个咒语都会带来一次冲击
保护以满足EMC领域的行业标准，并且
设计为在过电压条件下由于不正确而失效
现场接线。信号故障被隔离到单个CHARM。
符咒可以部分弹出到锁定位置，即：
断开系统的现场接线，以执行现场操作
维护操作或移除现场设备的电源。
激活符咒闩锁，将符咒弹出到卡位
位置关闭闩锁将护身符锁定到位，并且
隔离现场工作的现场接线。
CIOC通过以太网与多达四个
控制器，使系统具有极大的灵活性和易用性
膨胀可以将其他控制器添加到
适应增加的控制范围和I/O可以
在不改变物理布线的情况下重新分配。这允许
随着时间的推移，迁移所需的灵活性
I/O已安装在一个控制器上，仅用于
另一个原因是空间和/或可用I/O。
可以将魅力添加到任何现有的底板位置
以及在线自动感知。可以在线添加其他CIOC。
DeltaV迁移电子编组2020年8月
www.emerson。com/deltav 4
魅力类型
所有魅力类型都在迁移面板上运行。见三角洲
电子编组PDS和DeltaV是电子编组
PDS提供完整的魅力和IS魅力列表。
I/O端子板选项
所有IS和非IS I/O端子块类型在
通过选择正确的基板组件，迁移面板。
魅力钥匙柱
键控柱的功能相同。
CHARM I/O卡硬件
参见DeltaV电子编组PDS，DeltaV是电子的
编组以获得CIOC硬件的完整描述。
CHARM I/O卡载体
参见DeltaV电子编组PDS和DeltaV IS
完整描述的电子编组PDS
CIOC运营商硬件。
硬件规格
CHARM I/O迁移面板
环境规范
工作温度*-40至70°C（-40至158°F）**
储存温度-40至85°C（-40至185°F）
相对湿度5-95%，不冷凝
防护等级IP 20
空气污染物ISA-S71.04-1985 G3类空气污染物
保形涂层
冲击10 g½-正弦波持续11 ms
5至13.2 Hz的1 mm峰间振动；
0.7 g，从13.2到150 Hz
尺寸
高度：10.5英寸（26.7厘米）
深度6.68英寸（17.4厘米）
宽度19英寸（48.3厘米）
安装19英寸（48.3厘米）EIA导轨
6个机架单元（U）高
*在其温度范围的较高端长时间运行任何电子器件将缩短其预期寿命，
有关详细信息，请参阅机箱内的热量和气流影响白皮书。
**与铜以太网I/O端口（铜IOP）一起使用时。当与光纤I/O端口（光纤IOP）一起使用时，
工作温度范围限制在-40至60°C（-40至140°F）。
DeltaV迁移电子编组2020年8月
www.emerson。com/deltav 5
工作温度-40至70°C（-40至158°F）工作温度-20至60°C（-20至158°F）
CIOC载波以太网通信模块
CIOC迁移面板
DeltaV迁移电子编组2020年8月
www.emerson。com/deltav 6
CHARM基板迁移面板
环境规范
工作温度*-40至70°C（-40至158°F）
储存温度-40至85°C（-40至185°F）
相对湿度5-95%，不冷凝
防护等级IP 20
空气污染物ISA-S71.04-1985 G3类空气污染物
保形涂层
冲击10 g½-正弦波持续11 ms
5至13.2 Hz的1 mm峰间振动；
0.7 g，从13.2到150 Hz
尺寸
高度5.25英寸（13.3厘米）
深度4.8英寸（12.2厘米）
宽度19英寸（48.3厘米）
安装19英寸（48.3厘米）EIA导轨
3机架单元（U）高
*在其温度范围的高端长时间运行任何电子设备将缩短其预期寿命

KJ7102X1-BA1

KJ7102X1-BA1

3 EIA units (5.25 inches) which allows for each installation
to determine the mounting location within each cabinet.
The user can decide to reuse existing wire way / cable tray,
mount each assembly adjacent to each other, or mount with
spacing between each assembly. DeltaV CHARMs allow for
installation flexibility by allowing each assembly to be mounted
as needed to achieve the best result for each customer-specific
termination installation.
Each CHARM acts as a circuit protection device and field wiring
disconnects. Signals are current limited or fused to protect
against wiring faults to ground. Each CHARM provides surge
protection to meet industry standards in the area of EMC, and is
designed to fail during overvoltage conditions due to incorrect
field wiring. Signal faults are isolated to the single CHARM.
CHARMs can be partially ejected to a locked position that
disconnects the field wiring from the system to perform field
maintenance actions or to remove power to a field device.
Activating the CHARM latch ejects the CHARM to the detent
position. Closing the latch locks the CHARM in place and
isolates the field wiring for field work.
The CIOC communicates over Ethernet with up to four
controllers, allowing great flexibility and ease of system
expansion. Additional controllers can be added to
accommodate increased control scope and I/O can be
reassigned without changing the physical wiring. This allows
you the flexibility required in migrations where over time
I/O has been landed on one controller only to be used in
another because of space and or available I/O.
CHARMs can be added to any existing base plate position
and autosensed online. Additional CIOCs can be added online.
DeltaV Electronic Marshalling for Migrations August 2020
www.emerson.com/deltav 4
CHARM Types
All CHARM types function on the migration panel. See DeltaV
Electronic Marshalling PDS and DeltaV IS Electronic Marshalling
PDS for a complete listing of CHARMs and IS CHARMs.
I/O Terminal Block Options
All IS and non IS I/O Terminal Block types function on the
migration panel by choosing the right baseplate assembly.
CHARM Keying Posts
Keying Posts function the same.
CHARM I/O Card Hardware
See DeltaV Electronic Marshalling PDS and DeltaV IS Electronic
Marshalling for a complete description of CIOC Hardware.
CHARM I/O Card Carrier
See DeltaV Electronic Marshalling PDS and DeltaV IS
Electronic Marshalling PDS for a complete description
of CIOC Carrier Hardware.
Hardware Specifications
CHARM I/O Migration Panel
Environmental Specifications
Operating Temperature* -40 to 70°C (-40 to 158°F)**
Storage Temperature -40 to 85°C (-40 to 185°F)
Relative Humidity 5 to 95% , non-condensing
Protection Rating IP 20
Airborne Contaminants ISA-S71.04-1985 Airborne Contaminants Class G3
Conformal coating
Shock 10 g ½-sine wave for 11 ms
Vibration 1 mm peak-to-peak from 5 to 13.2 Hz;
0.7 g from 13.2 to 150 Hz
Dimensions
Height 10.5 in (26.7 cm)
Depth 6.68 in (17.4 cm)
Width 19 in (48.3 cm)
Mounting 19 in (48.3 cm) EIA rails
6 Rack Units (U) high
*Operating any electronics at the higher end of its temperature range for long periods of time will shorten its expected lifetime,
see Effects of Heat and Airflow Inside an Enclosure White Paper for more information.
** When used with copper Ethernet I/O Ports (Copper IOP). When used with the Fiberoptic I/O Ports (Fiberoptic IOP),
the operating temperature range is limited to -40 to 60°C (-40 to 140°F).
DeltaV Electronic Marshalling for Migrations August 2020
www.emerson.com/deltav 5
Operating Temperature -40 to 70°C (-40 to 158°F) Operating Temperature -40 to 60°C (-40 to 158°F)
CIOC Carrier Ethernet Communication Modules
CIOC Migration Panel
DeltaV Electronic Marshalling for Migrations August 2020
www.emerson.com/deltav 6
CHARM Baseplate Migration Panel
Environmental Specifications
Operating Temperature* -40 to 70°C (-40 to 158°F)
Storage Temperature -40 to 85°C (-40 to 185°F)
Relative Humidity 5 to 95%, non-condensing
Protection Rating IP 20
Airborne Contaminants ISA-S71.04-1985 Airborne Contaminants Class G3
Conformal coating
Shock 10 g ½-sine wave for 11 ms
Vibration 1 mm peak-to-peak from 5 to 13.2 Hz;
0.7 g from 13.2 to 150 Hz
Dimensions
Height 5.25 in (13.3cm)
Depth 4.8 in (12.2 cm)
Width 19 in (48.3 cm)
Mounting 19 in (48.3 cm) EIA rails
3 Rack Units (U) high
*Operating any electronics at the higher end of its temperature range for long periods of time will shorten its expected lifetime