140XCP40200模块备件

140XCP40200

用户偏移被添加到输入信号。偏移单位被指定为高电平输入的伏特、低电平输入的毫伏，
电阻式温度检测器输入为欧姆。默认用户偏移量为
零可以为指定单独的用户增益和偏移值
每个输入通道和每个输入类型。可以使用FC 217设置和重置用户增益和偏移值，
用户增益和偏移值保留在非易失性存储器中，以及
当模块电源中断时不会丢失。有关更多信息，请参阅编写器功能代码应用手册中的FC 217。
工程单位换算
热电偶和RTD输入转换为FC 216中规定的温度单位，即摄氏度或华氏度。转换表表示电压（或电阻）到
温度关系用于此转换。这个
用于执行转换的表取决于
指定了输入信号类型。
如果输入被识别为毫伏或高电平电压，
则指定的工程单位零和量程值为：
用于将输入读数转换为缩放工程单位
价值如果在转换为工程单位（FC 215和FC 216外部）之前需要进行特殊计算
块），然后是函数中指定的零和量程值
代码应设置为表示
输入然后，I/O模块FC 216将输出校正后的
可在控制器中处理的电压输入读数
诊断、安全和完整性检查
WBPEEUI240774A0 2-9
通过平方根、多项式或其他函数块，然后是标度函数，以提供工程中的值
单位。
自动校准
输入通道电路漂移的补偿通过以下方式完成：
使用
内部度低漂移参考。此功能对正常输入通道处理是透明的。
现场校准
在正常情况下，无需进行现场校准。它是
如果超高，可在现场执行校准程序
提供稳定、已知、确的参考。现场校准数据存储在非易失性存储器中。全域
校准程序见第4节。
工厂校准数据存储在的非易失性存储区域中。如果现场校准不能提供所需的
结果，可以恢复出厂校准数据。
使用FC 217更改每个通道的增益或偏移值
和类型，它可以补偿输入信号的差异
读数。调整这些参数可以代替字段
标定请参阅FC 217规范S1。
诊断、安全和完整性检查
IMASI23模块在通电期间执行内置测试
并在复位时检查模块的操作和完整性。
诊断模式下的诊断
ASI模块在诊断模式下执行内置测试，以：
检查模块操作。这些测试包括：
•A/D内部参考检查。
•开关测试。
•看门狗定时器测试。
•CPU测试。
•定时器测试。
•ROM测试。
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诊断、安全和完整性检查
•DPRAM测试。
•NVRAM测试。
•SRAM测试。
•系统参考检查。
•配置信道参考检查。
•未配置信道参考检查。
正常运行期间的诊断
在启动期间，ASI模块验证
PROM和非易失性RAM。看门狗定时器保护
防止A/D转换器故障，该故障将停止输入扫描。监控输入电路是否存在开路。任何错误
通过I/O模块状态报告给控制器。
这些诊断检测到的某些故障可能导致：
停止I/O模块。
复位诊断
这些测试包括：
•PROM校验和验证。
•NVRAM校验和验证。
•DPRAM/SRAM验证。
•处理器指令集测试。
•定时器测试。
I/O扩展器总线通信安全
扩展器总线消息完整性由校验和维护
每次发送和接收的计算

140XCP40200

140XCP40200
User offset is added to the input signal. Units of offset are specified as volts for high level inputs, millivolts for low level inputs,
and ohms for RTD inputs. The default user offset is a value of
zero. Separate user gain and offset values can be specified for
each input channel and each input type. The user gain and offset values can be set and reset using FC 217. Once defined,
user gain and offset values remain in nonvolatile memory and
are not lost when module power is interrupted. For more information refer to FC 217 in the Composer Function Code Application Manual.
Engineering Units Conversion
Thermocouple and RTD inputs are converted to the temperature units specified in FC 216, either degrees C or F. Conversion tables representing the voltage (or resistance) to
temperature relationship are used for this conversion. The
table used in performing the conversion depends upon the
input signal type specified.
If the input is identified as either millivolt or high level voltage,
then the specified engineering unit zero and span values are
used to convert the input reading to a scaled engineering unit
value. If special calculations need to be performed prior to conversion to engineering units (external to FC 215 and FC 216
blocks), then the zero and span values specified in the function
code should be set to represent a standard voltage span for the
input. The I/O module FC 216 would then output a corrected
voltage input reading which may be processed in the controller 
Diagnostic, Security, and Integrity Checks
WBPEEUI240774A0 2 - 9
through a square root, polynomial, or other function block followed by a scaling function to provide the value in engineering
units.
Automatic Calibration
Compensation for drift of input channel circuitry is done by
periodic automatic calibration of each A/D converter using an
internal precision low-drift reference. This function is transparent to normal input channel processing.
Field Calibration
Field calibration is not necessary in normal situations. It is
possible to perform calibration procedures in the field if ultra
stable, known, precision references are available. Field calibration data is stored in nonvolatile memory. The complete field
calibration procedure is in Section 4.
Factory calibration data is stored in a unique nonvolatile memory area. If field calibration does not provide the desired
results, the factory calibration data can be restored.
Using FC 217 to change the gain or offset values per channel
and type, it can compensate for differences in input signal
readings. Tuning these parameters can take the place of a field
calibration. Refer to FC 217, specification S1.
Diagnostic, Security, and Integrity Checks
The IMASI23 module performs built-in tests during power-up
and on reset to check the operation and integrity of the module.
Diagnostics in Diagnostic Mode
The ASI module performs built-in tests in diagnostic mode to
check module operation. These tests include:
• A/D internal reference checks.
• Switch test.
• Watchdog timer test.
• CPU test.
• Timer test.
• ROM test.
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Diagnostic, Security, and Integrity Checks
• DPRAM test.
• NVRAM test.
• SRAM test.
• System reference checks.
• Configured channel reference checks.
• Unconfigured channel reference checks.
Diagnostics During Normal Operation
During startup, the ASI module verifies the checksum of the
PROM and nonvolatile RAM. Watchdog timers safeguard
against an A/D converter failure which would halt input scanning. Input circuits are monitored for open circuits. Any errors
are reported to the controller through the I/O module status.
Certain failures detected by these diagnostics may result in
halting the I/O module.
Diagnostics on Reset
These tests include:
• PROM checksum verification.
• NVRAM checksum verificaation.
• DPRAM/SRAM verification.
• Processor instruction set tests.
• Timer test.
I/O Expander Bus Communication Security
Expander bus message integrity is maintained by checksum
calculations on each transmitted and receive